Method of determining library parameters using timing surface planarity
AssigneeMicron Technology, Inc.
InventorAnthony Mark Jones
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Abstract
The present invention relates to a characterizing a timing delay curve of a circuit component, said timing delay curve having a first region and a second region. The method includes determining a first delay equation representing the first region of the delay curve, determining a second delay equation representing the second region of the delay curve, and determining a corner capacitance representing a transition point from the first region to the second region.
Claims9
A method for characterizing a timing delay curve of a circuit component, said timing delay curve having a first region and a second region, comprising:
- determining a first delay equation representing said first region of the delay curve;
- determining a second delay equation representing said second region of the delay curve;
- and
- determining a corner capacitance of said circuit component, said corner capacitance representing a transition point from said first region to said second region.
8 The method of claim 1 wherein said determining a first delay equation further comprises:
- setting the delay, d, of said circuit component equal to
- 42 τ 1 - f [ 1 - 2 - ( 1 - f ) RC / τ ] ,
- where R represents the variable resistance of said component, C represents a capacitance of said component, τ represents an input signal edge time, and f represents a constant fraction between zero and one.
Dependencies are inferred from the claim text.