Multilayer ceramic package transmission line probe
AssigneeFreescale Semiconductor, Inc.
InventorsJohn C. Estes, Rudolfo Lucero, Anthony M. Pavio
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AssigneeFreescale Semiconductor, Inc.
InventorsJohn C. Estes, Rudolfo Lucero, Anthony M. Pavio
Estimating the term…
A multilayer ceramic structure (30) includes a first ceramic layer (32), a second ceramic layer (34) adjacent to the first ceramic layer, and a transmission line (38) formed between the first and second ceramic layers. The transmission line includes first and second portions (44, 46) having a first width, third and fourth portions (47, 48) formed between the first and second portions and having a second width that is narrower than the first width, and a fifth portion (49) formed between the third and fourth portions. A probe (40), comprising a conductively filled via, is attached at one end to the fifth portion, the probe passing through the second ceramic layer for providing a test point (42). The structure compensates for return loss induced by the probe.
A multilayer structure, comprising:
A multilayer ceramic structure, comprising:
A multilayer structure, comprising:
Dependencies are inferred from the claim text.