Method and system for analyzing diffraction data from crystalline systems
AssigneeAccelrys Software Inc.
InventorMarcus A. Neumann
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AssigneeAccelrys Software Inc.
InventorMarcus A. Neumann
Estimating the term…
A method and system for indexing powder diffraction data are disclosed comprising choosing a maximum impurity peak tolerance level for a crystallography data search, choosing a range of number of calculated peaks for possible indexing solutions having a minimum number of peaks and a maximum number of peaks, selecting a crystal system to search, selecting powder extinction classes to search for indexing solutions, performing an exhaustive unit cell search of each of the selected powder extinction classes using a successive dichotomy approach to determine a set of indexing results, and ranking the obtained solutions according to likelihood.
A method of indexing powder diffraction data, comprising:
A method for exploiting space group symmetry in the indexing of powder diffraction data, by selecting a crystal system to search, then grouping possible indexing solutions compatible with this crystal system into powder extinction classes having the same pattern of systematic absences, and performing separate indexing solution searches within at least two of said powder extinction classes.
A system for indexing a set of powder diffraction data, comprising:
A system for indexing a set of powder diffraction data, comprising:
A method of analyzing diffraction data comprising:
A system for indexing powder diffraction data, comprising:
Dependencies are inferred from the claim text.