Apparatus and method for characterizing libraries of different materials using x-ray scattering

A method for operating an x-ray characterization apparatus for characterizing a library containing a plurality of samples arranged in a predetermined pattern, said apparatus comprising an x-ray source for producing an x-ray beam, a stage for moving the library to align a pre-selected sample of said plurality of samples with the x-ray beam, and a detector for detecting a diffraction pattern, said method comprising the steps of:

• loading a library into the apparatus;
• activating the x-ray source to produce an x-ray beam traveling along a beampath;
• zeroing the stage when the library is in a predetermined position relative to the beampath to establish an reference origin for stage movement;
• actuating the stage to move the library to a first position in which a first pre-selected sample of said plurality of samples in the library is aligned with the beampath along which the x-ray beam travels;
• exposing the first pre-selected sample of said plurality of samples in the library to the x-ray beam thereby causing the x-ray beam to diffract and form a diffraction pattern characteristic of materials present in the first pre-selected sample;
• detecting with the apparatus detector the diffraction pattern resulting from exposure of the first pre-selected sample to the x-ray beam;
• recording the diffraction pattern resulting from exposure of the first pre-selected sample to the x-ray beam;
• activating the stage to move the library to a second position in which a second pre-selected sample of said plurality of samples in the library is aligned with the beampath along which the x-ray beam travels;
• exposing the second pre-selected sample of said plurality of samples in the library to the x-ray beam thereby causing the x-ray beam to diffract and form a diffraction pattern characteristic of materials present in the second pre-selected sample;
• detecting with the apparatus detector the diffraction pattern resulting from exposure of the second pre-selected sample to the x-ray beam;
• and
• recording the diffraction pattern resulting from exposure of the second pre-selected sample to the x-ray beam.

Apparatus for characterizing a library containing an array of material members comprising:

• an x-ray beam source;
• a beamline being adapted to direct, with a predefined beam cross-section, the x-ray beam onto the library;
• a chamber adapted to hold the library;
• library positioning means adapted to position the library relative to the x-ray beam so as to make each member exposable to the x-ray beam;
• and
• a detector allowing the detection of a photon scattered by one of the members exposed to the x-ray beam in order to generate characterization data for said one member.

A method for characterizing a library containing an array of members, comprising the steps of:

• adjusting environmental characteristics surrounding the library;
• directing an x-ray beam generated by an x-ray source and having a predefined beam cross-section onto the library by means of a beamline;
• moving the library by a library positioning means in a predetermined manner to expose a member of the library to the x-ray beam in order to rapidly characterize each member in the library;
• and
• detecting photons scattered by the member in order to characterize the member.