Method for achieving process uniformity by modifying thermal coupling between heater and substrate
AssigneeApplied Materials, Inc.
InventorsDavid P. Sun, Steven Glanoulakis
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AssigneeApplied Materials, Inc.
InventorsDavid P. Sun, Steven Glanoulakis
Estimating the term…
The present invention is directed to achieving a desired the process uniformity of a substrate by modifying the distribution of thermal coupling between the substrate and the heater which heats the substrate. In one embodiment, the method comprises establishing a correlation between a uniformity parameter of the process to be performed on the substrate and a surface feature of a heater surface of the heater which is in substantially full contact with a bottom surface of the substrate. The method further comprises determining a desired surface feature of the heater surface of the heater in substantially full contact with the substrate, based on the correlation between the uniformity parameter of the process to be performed on the substrate and the surface feature of the heater surface of the heater, to achieve a preset process uniformity of the uniformity parameter.
A method of achieving a desired process uniformity of processing a substrate which is heated by a heater, the method comprising:
A method of performing a process with a desired uniformity on a substrate, the method comprising:
A method of achieving a desired uniformity of a process to be performed on a substrate which is heated by a heater, the method comprising:
A heater for heating a substrate in a chamber for forming a layer on the substrate from a process gas, the heater comprising:
Dependencies are inferred from the claim text.