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AssigneeAgilent technologies, Inc. and Sandia Technologies, Inc.
InventorsYasuhiko Iguchi, Hiroshi Tamura, Enokida Mitsuhiro, Earl Louis Dombroski, Thomas Robert Claus
Estimating the term…
A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation. In this system, when a new analysis operation is specified, the processing means (101) processes the input test data in accordance with the analysis operation, and processes at least one of the analysis target data, historical data, and display data by the new analysis operation.
A semiconductor test data analysis system which automatically records operation information of an analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation, this system comprising:
A method for analyzing semiconductor test data implemented in a semiconductor test data analysis system, which includes a processing means, an analysis target data storage means, a historical data storage means, and a display data storage means, the method comprising:
19 The method for analyzing semiconductor test data according to claim 18, wherein processing the test data by the processing means further comprises reading test data from database or data file, and storing the test data as analysis target data in the analysis target data storage means by the newly specified analysis operation.
Dependencies are inferred from the claim text.