Method for forming contact plug of semiconductor device
AssigneeHynix Semiconductor Inc.
InventorsSung-Kwon Lee, Dong-Sauk Kim, Hyung-Soon Park, Ho-Seok Lee, Sang-Ik Kim
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AssigneeHynix Semiconductor Inc.
InventorsSung-Kwon Lee, Dong-Sauk Kim, Hyung-Soon Park, Ho-Seok Lee, Sang-Ik Kim
Estimating the term…
The present invention provides a method for forming a contact plug of a semiconductor device capable of preventing an attack to conductive patterns. The method includes the steps of: forming a plurality of conductive patterns on a substrate; forming an insulating layer on top of an entire structure including the plurality of the conductive pattern; forming a contact hole by selectively etching the insulating layer; forming a conductive layer for a contact plug on the entire structure including the contact hole; forming a metal sacrificial layer on the entire structure including the conductive layer; exposing the conductive layer by performing an etchback process to the metal sacrificial layer, wherein the metal sacrificial layer is left on a lower topology area induced by the conductive patterns; and forming plugs, each being isolated by polishing the remained metal sacrificial layer, the conductive layer and the insulating layer through the use of slurry.
A method for forming a contact plug of a semiconductor device, comprising the steps of:
A method for forming a contact plug of a semiconductor device, comprising the steps of:
A method for forming a contact plug of a semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.