Method for manufacturing semiconductor device
AssigneeHitachi Kokusai Electric Inc.
InventorsYutaka Nishino, Kenichi Suzaki, Norikazu Mizuno
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi Kokusai Electric Inc.
InventorsYutaka Nishino, Kenichi Suzaki, Norikazu Mizuno
Estimating the term…
In a method for manufacturing a semiconductor device, the following three steps (oxide film forming step, cycle purge step, and coating step) are performed sequentially before performing substrates processing with a semiconductor device manufacturing apparatus. In the oxide film forming step, an oxide film 28 is grown on the surfaces of a flange portion 27 and a cap portion 30 which compose metal parts of a furnace port by baking the furnace port 40 so that corrosion resistance is improved. In the cycle purge step, residual moisture on the part of a gas supply system 35 and inside the piping is removed to suppress a chemical reaction between DCS gas which increases corrosiveness by reaction with moisture, and the metal parts 41 of the furnace port. In the coating step, the DCS gas is continuously supplied to the gas supply system 35, and a SiO2 film is coated on the surface of the flange portion 27 and the cap portion 30, and at the same time a residue containing metal such as Fe and the like which remains in the inside of the supply system 35 is changed into chloride or the like which is high in vapor pressure so that the chloride is discharged.
A method for manufacturing a semiconductor device, comprising the steps of:
A method for manufacturing a semiconductor device, comprising the steps of:
A method for manufacturing a semiconductor device, comprising the steps of:
A method for manufacturing a semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.