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AssigneeRobert Bosch GmbH
InventorsRuediger Giesel, Dieter Seifert, Rene Wolf, Ralf Henne
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Proposed is a method for programming and/or testing for the correct functioning of an electronic circuit, and a corresponding device, which is used to efficiently program and test electronic circuits combined on a wafer, prior to their separation. For this purpose, a bus allowing the individual electronic circuits to be sequentially tested is positioned on the wafer. Each electronic circuit is assigned an address for the bus, using a hardware code. The address is deactivated after completion of the functionality and testing method.
A method for performing at least one of a programming and a testing for correct functioning of a first electronic circuit of a plurality of electronic circuits that are joined by an electrical interconnection, the method comprising:
A device for performing at least one of a programming and a testing for correct functioning of a plurality of electronic circuits that are joined by an electrical interconnection, comprising:
Dependencies are inferred from the claim text.