Thermally stable crystalline defect-free germanium bonded to silicon and silicon dioxide
AssigneeIntel Corporation
InventorsMohamad A. Shaheen, Beenyih Jln, Robert S. Chau
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AssigneeIntel Corporation
InventorsMohamad A. Shaheen, Beenyih Jln, Robert S. Chau
Estimating the term…
A wafer pair comprising a substantially defect-free germanium wafer and methods of making the same. The wafer pair comprises the substantially defect-free germanium wafer directly bonded to a silicon wafer. The method of making the wafer pair comprises placing the silicon wafer in a wafer-bonding chamber, placing the germanium wafer on top or on bottom of the silicon wafer, and applying a local force to either the germanium wafer or to the silicon wafer to initiate bonding of the germanium wafer to the silicon wafer. The bonding occurs under a temperature ranging from about 23° C. to about 600° C. and under a vacuum condition inside a wafer-bonding chamber.
A method of forming a substantially defect-free germanium film on a semiconductor wafer comprising:
A method as in claim 11 wherein said desired bonding pressure is a sub-atmospheric pressure to place said wafer-bonding chamber under a vacuum condition.
A method of forming a substantially defect-free germanium film on a semiconductor wafer comprising:
A wafer pair for integrating into an electronic device comprising:
Dependencies are inferred from the claim text.