Centralized control architecture for a laser materials processing system
AssigneeHypertherm, Inc.
InventorsTate S. Picard, Kenneth J. Woods, Roger E. Young JR., William J. Connally
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AssigneeHypertherm, Inc.
InventorsTate S. Picard, Kenneth J. Woods, Roger E. Young JR., William J. Connally
Estimating the term…
Apparatus, systems, and methods for monitoring the processing of a workpiece that includes directing an incident laser beam onto the workpiece and using an optical detector for measuring a signal emitted from the workpiece as a result of the incident laser beam. The detector generates at least two signals based upon the optical signal. The method also involves use of a light source monitor in determining workpiece processing quality based upon the quotient of the two outputs as well as a magnitude of one of the two quotients.
A method of controlling a laser beam system, the method comprising the steps of:
An apparatus for controlling a laser beam system, said apparatus comprising:
A method of controlling a material processing system, the method comprising the steps of:
Dependencies are inferred from the claim text.