Magnetron sputtering source and chamber therefor
AssigneeUnaxis Deutschland GmbH
InventorsBernhard Cord, Gerd Deppich, Karl-Heinz Schuller, Oliver Keitel
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AssigneeUnaxis Deutschland GmbH
InventorsBernhard Cord, Gerd Deppich, Karl-Heinz Schuller, Oliver Keitel
Estimating the term…
An apparatus with a magnetron sputtering-coating chamber, source, target and substrate holder, includes a magnet arrangement for generating on a surface of the target, at least two tunnel-shaped magnetron magnetic fields in the form of closed loops that are substantially concentrically to, and spaced from each other. The surface consisting of a material with at least two elements of different weight. The distance between the substrate and target surface, the substrate radius, loci of erosion patterns in the surface and the radius and placement of the loops are all related to each other.
A magnetron sputtering source with a target having a surface to be sputtered, comprising a magnet arrangement for generating on said surface at least two tunnel-shaped magnetron magnetic fields in the form of closed loops that are substantially concentrically to, and spaced from each other, said surface consisting of a material with at least two elements of different weight.
An apparatus comprising a sputter-coating chamber with a magnetron sputtering source having a circular disk-shaped or annular and planar target and a substrate holder for receiving a circular disk-shaped or annular substrate, said target having a surface to be sputtered that is substantially parallel to a substrate received in said substrate holder, said magnetron sputtering source having means for generating a closed loop, tunnel-shaped magnetron magnetic field that is coaxial about a central axis of said target, a radial distance RH of a circular locus of maximum magnetic field strength of said magnetron magnetic field parallel to said surface and a maximum radius r of the circular disk-shaped or annular substrate on said substrate holder being 1.2 r≦RH≦5 r, and wherein said surface of said target is made of a material with at least two elements of different weight.
An apparatus comprising a sputter-coating chamber with a magnetron source having a circular disk-shaped or annular and planar target and a substrate holder for holding a circular disk-shaped or annular substrate coaxially with the target and parallel to a sputtering surface of the target, said magnetron source having means for generating at least one sputtering erosion loop with a radius RE in said surface coaxially to said target and wherein, for the radius RE and for a maximum radius r of a substrate held on said substrate holder, 1.2 r≦RE≦5 r, and wherein said surface is made of a material with at least two elements of different weight.
A magnetron sputter-coating chamber with a magnetron source and with a substrate mounting for receiving a substrate spaced from and parallel to a target having a surface, and wherein said substrate mounting is adapted to hold a circular or annular substrate with a maximum radius r and wherein a distance d between said surface and a substrate on said substrate mounting fulfills:
A magnetron sputter-coating chamber apparatus comprising a magnetron sputtering source having a circular disk-shaped or annular and planar target about a central axis and defining for a sputtering surface of said target, a substrate holder for holding a circular disk-shaped or annular substrate coaxial to said axis and spaced from said surface and substantially parallel to said surface, said surface having a loop of sputtering excavation coaxial to said axis defining for a circular locus of maximum erosion depth at a radius RE with respect to said axis, a substrate held within said substrate holder having a distance d from said target surface and a difference of said radius RE of said locus and of a maximum substrate radius r being ΔRE, wherein 0.33 d≦ΔRE≦4 d and wherein said surface consists of a material with at least two elements of different weight.
A magnetron sputter-coating chamber apparatus with a circular disk-shaped or annular and planar target about a central axis, a substrate holder for holding a circular disk-shaped or annular substrate distant from and parallel to sputter surface of said target, a sputter source having at least one tunnel-shaped magnetic field loop substantially coaxial to said axis and upon said surface defining a circular locus of maximum magnetic field strength parallel to said surface with a radius RH with respect to said axis and wherein said radius RH is larger by an amount ΔRH than a maximum radius of a substrate held in said substrate holder and wherein further said substrate in said substrate holder is spaced by an amount d from said target surface and wherein 0.33 d≦ΔRH≦4 d and wherein said surface is of a material which has at least two elements of different weight.
A magnetron sputter-coating chamber apparatus with a planar target having a sputtering surface, a substrate holder for holding a substrate distant from and parallel to surface, a magnetron sputtering source having at least two concentric erosion areas of sputtering in said surface that are mutually separate from each other, an outer one of said erosion areas forming a circular loop about a central axis and defining for a circular locus of maximum erosion, a next inner one of said al least two erosion areas defining for a locus of maximum erosion, wherein the radial distance of said circular locus and of said locus is ΔρH and wherein for a distance d between the substrate and surface ΔρH≦2 d, wherein said surface consists of a material with at least two elements of different weight.
A sputter-coating chamber apparatus with a planar target having a sputtering surface, a substrate holder for holding a substrate distant from and parallel to surface and comprising at least two concentric patterns of tunnel-shaped magnetic fields upon said surface and radially distant from each other, at first one of said patterns defining for a circular locus of maximum magnetic field strength to said surface and a second one of said patterns adjacent and inside said first pattern defining a locus of maximum magnetic field strenth parallel to said surface, said circular locus having a radial distance from said locus of ΔρH and said substrate held in said substrate holder having a distance d from said surface, wherein ΔρH≦2 d, wherein said surface consists of a material with at least two elements of different weight.
Dependencies are inferred from the claim text.