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US 2003/0197205 A1Published application
Capacitor having RuSixOy-containing adhesion layers
AssigneeMicron Technology, Inc.
InventorsEugene P. Marsh, Brenda D. Kraus
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AssigneeMicron Technology, Inc.
InventorsEugene P. Marsh, Brenda D. Kraus
Estimating the term…
A method for use in the fabrication of integrated circuits includes providing a substrate assembly having a surface. An adhesion layer is formed over at least a portion of the surface. The adhesion layer is formed of RuSixOy, where x and y are in the range of about 0.01 to about 10. The adhesion layer may be formed by depositing RuSixOy by chemical vapor deposition, atomic layer deposition, or physical vapor deposition or the adhesion layer may be formed by forming a layer of ruthenium or ruthenium oxide over a silicon-containing region and performing an anneal to form RuSixOy from the layer of ruthenium and silicon from the adjacent silicon-containing region. Capacitor electrodes, interconnects or other structures may be formed with such an adhesion layer. Semiconductor structures and devices can be formed to include adhesion layers formed of RuSixOy.
A capacitor structure comprising:
A capacitor structure comprising:
A capacitor structure comprising:
Dependencies are inferred from the claim text.