Process for manufacturing a semiconductor substrate as well as a semiconductor thin film, and multilayer structure
AssigneeCanon Kabushiki Kaisha
InventorsKIYOFUMI SAKAGUCHI, TAKAO YONEHARA, NOBUHIKO SATO
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AssigneeCanon Kabushiki Kaisha
InventorsKIYOFUMI SAKAGUCHI, TAKAO YONEHARA, NOBUHIKO SATO
Estimating the term…
A process for manufacturing a semiconductor substrate, comprising the step of preparing a first substrate which has a surface layer portion subjected to hydrogen annealing, the separation-layer formation step of implanting ions of hydrogen or the like into the first substrate from the side of the surface layer portion, thereby to form a separation layer, the adhesion step of bonding the first substrate and a second substrate to each other so that the surface layer portion may lie inside, thereby to form a multilayer structure, and the transfer step of separating the multilayer structure by utilizing the separation layer, thereby to transfer the less-defective layer of the surface layer portion onto the second substrate. The less-defective layer is a single-crystal silicon layer in which defects inherent in a bulk wafer, such as COPs and FPDs, are decreased.
A process for manufacturing a semiconductor substrate, comprising:
A process for manufacturing a semiconductor substrate, comprising:
A process for manufacturing a semiconductor thin film, comprising:
A process for manufacturing a semiconductor substrate, comprising:
In a multilayer structure wherein a first silicon substrate and a second substrate are bonded to each other, the first silicon substrate including therein a separation layer which has been formed by implanting ion of at least one element selected from the group consisting of hydrogen, nitrogen and rare gases;
Dependencies are inferred from the claim text.