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US 2003/0164353 A1Published application
Method for manufacturing semiconductor device
AssigneeNEC Electronics Corporation
InventorKyoichi Tsubata
Life of this patent
Estimating the term…
Abstract
The manufacturing method of the semiconductor device provides reduction of the photoresist film distortion occurred in a development procedure and, as a result, makes measurement of the place difference of the photoresist mask correct. The manufacturing method of the semiconductor device to be published are those the photoresist film consisting the upper alignment-measuring mark is placed more than about 200 μm from an corner in device forming region formed adjoining scribing region, along with X-direction which is the measurement direction in scribing region formed on semiconductor substrate.
Claims24
A method for manufacturing a semiconductor device comprising:
- a first step of forming a first alignment-measuring mark having a recessed pattern on a surface of a semiconductor substrate, by using a photoetching process;
- a second step of coating said surface of said semiconductor substrate on which said first alignment-measuring mark is formed, with a photoresist film;
- a third step of patterning said photoresist film by using a photolithography technique and of forming a photoresist mask with a second alignment-measuring mark on said semiconductor substrate, wherein said second alignment-measuring mark is aligned to be overlaid on said first alignment-measuring mark;
- hereby measuring a relative deviation from a right alignment between said first alignment-measuring mark and said second alignment-measuring mark;
- wherein said second alignment-measuring mark is placed at a specified position on said semiconductor substrate so that a ratio between a total area of photoresist-removed portions and a total area of photoresist-remaining portions within a first specified region extending in a first measuring direction from a center of said second alignment-measuring mark is equal approximately to that within a second specified region extending in a second measuring direction opposite to said first measuring direction from said center of said second alignment-measuring mark, said first alignment-measuring mark and said second alignment-measuring mark being located outside a cell region, and said first specified region and said second specified region being set outside said cell region.
2 more elements
A method for manufacturing the semiconductor device comprising:
- a first step of forming a first alignment-measuring mark having a recessed pattern on a surface of a semiconductor substrate, by using a photoetching process;
- a second step of coating said surface of said semiconductor substrate on which said first alignment-measuring mark is formed, with a photoresist film;
- a third step of patterning said photoresist film by using a photolithography technique and of forming a photoresist mask with a second alignment-measuring mark on said semiconductor substrate, wherein said second alignment-measuring mark is aligned to be overlaid on said first alignment-measuring mark;
- hereby measuring a relative deviation from a right alignment between said first alignment-measuring mark and said second alignment-measuring mark;
- wherein said second alignment-measuring mark is placed at a specified position on said semiconductor substrate so that a ratio between a total area of photoresist-removed portions and a total area of photoresist-remaining portions within a first specified region extending in a first measuring direction from a center of said second alignment-measuring mark is equal approximately to that within a second specified region extending in a second measuring direction opposite to said first measuring direction from said center of said second alignment-measuring mark, said first alignment-measuring mark and said second alignment-measuring mark being located outside a device forming region, and said first specified region and said second specified region being set outside said device forming region;
- and
- wherein said second alignment-measuring mark is placed at a distance of more than 200 μm from a corner of said device forming region being adjacent to said first specified region or said second specified region, in said first measuring direction or said second measuring direction.
4 more elements
A method for manufacturing a semiconductor device comprising:
- a first step of forming an insulating film on a semiconductor substrate and then of forming a first alignment-measuring mark having a recessed pattern on a surface of formed said insulating film, by using a photoetching process;
- a second step of coating said surface of said insulting film on which said first alignment-measuring mark is formed, with a photoresist film;
- a third step of patterning said photoresist film by using a photolithography technique and of forming a photoresist mask with a second alignment-measuring mark on said insulting film, wherein said second alignment-measuring mark is aligned to be overlaid on said first alignment-measuring mark;
- hereby measuring a relative deviation from a right alignment between said first alignment-measuring mark and said second alignment-measuring mark;
- wherein said second alignment-measuring mark is placed at a specified position on said insulting film so that a ratio between a total area of photoresist-removed portions and a total area of photoresist-remaining portions within a first specified region extending in a first measuring direction from a center of said second alignment-measuring mark is equal approximately to that within a second specified region extending in a second measuring direction opposite to said first measuring direction from said center of said second alignment-measuring mark, said first alignment-measuring mark and said second alignment-measuring mark being located outside a cell region, and said first specified region and said second specified region being set outside said cell region.
2 more elements
A method for manufacturing a semiconductor device comprising:
- a first step of forming an insulating film on a semiconductor substrate and then of forming a first alignment-measuring mark having a recessed pattern on a surface of formed said insulating film, by using a photoetching process;
- a second step of coating said surface of said insulting film on which said first alignment-measuring mark is formed, with a photoresist film;
- a third step of patterning said photoresist film by using a photolithography technique and of forming a photoresist mask with a second alignment-measuring mark on said insulting film, wherein said second alignment-measuring mark is aligned to be overlaid on said first alignment-measuring mark;
- hereby measuring a relative deviation from a right alignment between said first alignment-measuring mark and said second alignment-measuring mark;
- wherein said second alignment-measuring mark is placed at a specified position on said insulting film so that a ratio between a total area of photoresist-removed portions and a total area of photoresist-remaining portions within a first specified region extending in a first measuring direction from a center of said second alignment-measuring mark is equal approximately to that within a second specified region extending in a second measuring direction opposite to said first measuring direction from said center of said second alignment-measuring mark, said first alignment-measuring mark and said second alignment-measuring mark being located outside a device forming region, and said first specified region and said second specified region being set outside said device forming region;
- and
- wherein said second alignment-measuring mark is placed at a distance of more than 200 μm from a corner of said device forming region being adjacent to said first specified region or said second specified region, in said first measuring direction or said second measuring direction.
4 more elements
Dependencies are inferred from the claim text.