Semiconductor device and method of fabricating semiconductor device
AssigneeSony Corporation
InventorJunichiro Kobayashi
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AssigneeSony Corporation
InventorJunichiro Kobayashi
Estimating the term…
To provide a semiconductor device which makes it possible to avoid deterioration in step coverage property at a gate electrode provided on an operating region, and decrease a leakage current between the operating region and the gate electrode. The semiconductor device arranged as a HEMT is made to include operating region composed of multilayer films such as a channel layer, an electron supplying layer and other semiconductor layer and having an island structure independently mesa-isolated from one another. The semiconductor device also includes a gate electrode and an impurity diffusion layer provided on the surface of the operating region, the impurity diffusion layer being doped with an impurity having a conductivity type inverse to the impurity doped into the electron supplying layer.
A semiconductor device having an operating region being formed by mesa-isolating multilayer films of semiconductor layers including a first conductivity type impurity into an island structure, and an electrode film provided on said operation region so as to extend from an upper surface to a side wall of said operating region, wherein
A method of fabricating a semiconductor device comprising the steps of:
A method of fabricating a semiconductor device comprising the steps of:
Dependencies are inferred from the claim text.