Manufacturing method of photomask
OwnerYasuhiro Koizumi, Shiho Sasaki +4inventors
InventorsYasuhiro Koizumi, Shiho Sasaki, Akiko Fujii, Morihisa Hoga, Norio Hasegawa, Katsuya Hayano
Life of this patent
Estimating the term…
Loading patent…
OwnerYasuhiro Koizumi, Shiho Sasaki +4inventors
InventorsYasuhiro Koizumi, Shiho Sasaki, Akiko Fujii, Morihisa Hoga, Norio Hasegawa, Katsuya Hayano
Estimating the term…
It is an object of the present invention to provide manufacturing method of a photomask, the method enabling the provision of a resist pattern photomask which is free from the sticking of foreign matter and has high quality. The manufacturing method of a photomask comprises applying a photoresist directly to a substrate and patterning the photoresist to produce a photomask with a resist pattern, the method further comprising a process of attaching a pellicle to the substrate before inspection processs after forming the resist pattern by carrying out a process of applying the resist to the substrate, an exposure/drawing process and a developing process.
A manufacturing method of a photomask, the method comprising applying a resist directly to a substrate and patterning the resist to produce a photomask with a resist pattern, the method further comprising a process of attaching a pellicle to the substrate before an inspection process after forming the resist pattern by applying the resist, carrying out an exposure/drawing process and a developing process.
A manufacturing method of a photomask, the method comprising applying a resist directly to a substrate and patterning the resist to produce a photomask with a resist pattern, the method further comprising a process of attaching a temporary pellicle to the substrate before an inspection process after forming the resist pattern by applying the resist, carrying out an exposure/drawing process and a developing process and a process of applying a real pellicle in place of the temporary pellicle to the photomask which has passed through the subsequent inspection process and passed the inspection.
A manufacturing method of a photomask, the method comprising applying a resist directly to a substrate and patterning the resist to produce a photomask with a resist pattern, wherein a series of processes involving a process applying the resist, an exposure/drawing process, a developing process, an inspection process, a process of attaching a pellicle and a final inspection process are carried out in a treating system disposed in a closed system.
A manufacturing method of a photomask, the method comprising applying a resist directly to a substrate and patterning the resist to produce a photomask with a resist pattern, wherein after the resist is applied to the substrate, an exposure/drawing process and a developing process are carried out using the substrate from which the resist stuck to the sides and backside of the substrate is removed, to form a resist pattern.
Dependencies are inferred from the claim text.