Apparatus and method for inspecting working operations on circuit substrate, and system and method for fabricating electric circuit
AssigneeFuji Machine Mfg. Co., Ltd.
InventorsTakayoshi Kawai, Kazuo Mitsui
Life of this patent
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AssigneeFuji Machine Mfg. Co., Ltd.
InventorsTakayoshi Kawai, Kazuo Mitsui
Estimating the term…
Where a result of operations to mount electronic components is inspected, for example, an operating procedure of an inspecting operation is determined on the basis of mounting-condition information such as used-device information relating to used suction nozzles, feeders and other devices, and mounting-result information such as information relating to recovery actions. The operating procedure may be determined on the basis of device-usage hysteresis information as well. For instance, the inspection operation is performed on inspecting objects selected from the mounting objects, such as mounting objects mounted with nozzles of high mounting defect ratios, mounting objects mounted with feeders of long use, etc. Additional inspecting objects are selected such that each mounting object is inspected at a predetermined frequency or such that the inspection can be effected within a predetermined time. The inspecting order may be determined so as to complete the inspection in a shortest possible time.
A substrate-working-result inspecting apparatus for inspecting a result of substrate working operations performed on a circuit substrate, comprising:
A substrate-working-result inspecting method of inspecting a result of substrate working operations performed on a circuit substrate, comprising:
A substrate-working-result inspecting program executed by a computer, to inspect a result of substrate working operations performed on a circuit substrate, comprising:
An electric-circuit fabricating system including at least one substrate working apparatus for performing predetermined substrate working operations on a circuit substrate, and a substrate-working-result inspecting apparatus for inspecting a result of said substrate working operations performed by said at least one substrate working apparatus, said substrate-working-result inspecting apparatus comprising:
An electric-circuit fabricating method including a substrate working step of performing predetermined substrate working operations on a circuit substrate, and a substrate-working-result inspecting step of inspecting a result of said substrate working operations, said substrate-working-result inspecting step comprising:
An electric-circuit fabricating program executed by a computer, to perform substrate working operations, and inspect a result of the substrate working operations, comprising:
Dependencies are inferred from the claim text.