System and method for estimating reliability of components for testing and quality optimization
AssigneeAuburn University
InventorsAdit D. Singh, Thomas S. Barnett
Life of this patent
Estimating the term…
Abstract
A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the electronic component based on that classification with the aim of optimizing test costs and product quality.
Claims46
A method of determining the reliability of a component, said method comprising:
- classifying the component based on an initial determination of a number of fatal defects;
- and
- estimating a probability of latent defects present in the component based on said classification, by integrating yield information based on the initial determination of a number of fatal defects using a statistical defect-clustering model.
A method of determining the reliability of a repairable component, said method comprising:
- performing an initial test on the component to identify repairable defects in the component;
- and
- classifying the component based on the number of repairable defects identified by the initial test.
A method of determining the reliability of a component, said method comprising:
- classifying the component based on an initial determination of a number of neighboring components having fatal defects;
- and
- testing a sample of components from fewer than all of a plurality of classifications to estimate a probability of latent defects present in the component.
A method for predicting the reliability of a component, said method comprising:
- classifying a component into one of a plurality of classifications based on an initial test for killer defects;
- and
- optimizing further testing of the component to identify the presence of latent defects, based on the classification thereof.
Dependencies are inferred from the claim text.