Anti-fuse circuit and method of operation

An anti-fuse circuit, comprising:

• a sensing output;
• an anti-fuse transistor coupled to the sensing output;
• and
• anti-fuse enable circuitry, coupled to the anti-fuse transistor, for coupling a supply voltage to the anti-fuse transistor at least once, wherein:
• prior to coupling the supply voltage to the anti-fuse transistor, the sensing output providing a first output value corresponding to the anti-fuse transistor operating in a un-programmed state as a normal transistor;
• and
• after coupling the supply voltage to the anti-fuse transistor, the sensing output providing a second output value corresponding to the anti-fuse transistor operating in a programmed state as a degraded transistor having a permanently conductive gate dielectric.

A method of operating an anti-fuse circuit, comprising:

• enabling anti-fuse enabling circuitry coupled to an anti-fuse transistor;
• and
• forming a degraded transistor having a permanently conductive gate dielectric, wherein forming comprises:
• applying a first voltage supply, via the anti—fuse enabling circuitry, for a first time period, to a gate electrode of an anti-fuse transistor to form the degraded transistor, the degraded transistor corresponding to a programmed state of the anti-fuse transistor.