Semiconductor device having temperature detecting function, testing method, and refresh control method of semiconductor storage device having temperature detecting function

A semiconductor device having a temperature detecting function, comprising:

• a temperature detecting unit for detecting a predetermined temperature;
• a first voltage biasing unit for outputting a first voltage to bias the positive supply side of the temperature detecting unit;
• and
• a second voltage biasing unit for outputting a second voltage dropped by a predetermined voltage from the first voltage biasing unit, to bias the negative supply side of the temperature detecting unit,
• wherein the temperature detecting unit is biased with the predetermined voltage.

A method for testing a semiconductor device having a temperature detecting function, comprising:

• a testing temperature detecting step of detecting a testing temperature at a temperature characteristic testing time;
• an error measuring step of measuring an error quantity of the detected result of the testing temperature;
• and
• a correction step of correcting a temperature detecting unit for detecting a predetermined temperature, on the basis of the measured error quantity.

A method for testing a semiconductor device having a temperature detecting function, comprising:

• a testing temperature detecting step of making at least two kinds of the detections of a testing temperature, the detection of a first near temperature having a slight detecting temperature difference on a higher temperature side with respect to the testing temperature and the detection of a second near temperature having a slight detecting temperature difference on a lower temperature side, at a temperature characteristic testing time;
• an error measuring step of measuring the difference till the detected results of the two end temperatures of the at least two kinds of detections are contrary to each other, as a detection error;
• and
• a correction step of correcting a temperature detecting unit for detecting a predetermined temperature on the basis of the measured error quantity.