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AssigneeIntel Corporation
InventorsCarlos A. Gonzalez, Song-Hua Shi, Milan Djukic
Estimating the term…
High yield, high reliability, flip-chip integrated circuit (IC) packages are achieved utilizing a combination of heat and pressure to bond flip-chip die and to cure no-flow underfill material. The underfill comprises a filler or low coefficient of thermal expansion (CTE) material to decrease CTE of the cured underfill. The filler material can be selected from the group comprising silica, silicon oxide, silicon dioxide, silicon nitride, aluminum oxide, aluminum nitride, or a mixture thereof. The filler material may also increase the viscosity of the uncured underfill and/or increase the modulus of elasticity of the cured underfill. In some method embodiments, a thermocompression bonder is used to simultaneously provide solder bump reflow and underfill curing. Application of various methods to a component package, an electronic assembly, and an electronic system are also described.
A method comprising:
A component package fabricated by:
An electronic assembly comprising at least one integrated circuit (IC) package fabricated by:
An electronic system comprising:
Dependencies are inferred from the claim text.