Control gate decoder for twin MONOS memory with two bit erase capability
AssigneeHalo LSI, Inc.
InventorTomoko Ogura
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AssigneeHalo LSI, Inc.
InventorTomoko Ogura
Estimating the term…
The present invention is a decoder for control gate lines of a twin MONOS flash memory array. Decoder units connected to each control gate line of the memory are controlled to provide select, override and unselect voltages to perform read, program and erase operations. The decoder units are divided into odd and even addressing where separate voltages can be applied control gates of to adjacent memory cells. Override voltages, which prevent operations of a selected cell from affecting adjacent memory cell storage sites, can be applied to the control gates of immediate neighboring cells of the selected sell. Unselected voltages can be applied to beyond the immediate neighboring cells to further prevent disturb conditions in remote cells.
A method for selecting a storage site within a twin MONOS flash memory for reading and programming using control gate override selection, comprising:
A method for selecting a storage site within a twin MONOS flash memory for reading and programming using bit line override selection, comprising:
A control gate line decoder for an array containing twin MONOS flash memory cells, comprising:
A means for decoding control gate signals for a twin MONOS flash memory, comprising:
23 The means of claim 22, further comprising:
The means of claim 23, wherein said second decoding means selects said second voltage to connect said override voltage to cells neighboring both sides of said selected memory cell.
25 The means of claim 22, further comprising:
The means of claim 25, wherein said first decoding means selects said first voltage to connect said override voltage to cells neighboring both sides of said selected memory cell.
Dependencies are inferred from the claim text.