Wavemeter with increased wavelength range
AssigneeAgilent Technologies, Inc.
InventorThomas Jensen
Life of this patent
Estimating the term…
Abstract
A wavemeter (30) comprises a first wavelength determination unit (40) having a substantially periodic wavelength dependency and being adapted for providing a reference wavelength dependency (100) over a reference wavelength range. A second wavelength determination unit (50) has a substantially periodic wavelength dependency and is adapted for providing a second wavelength dependency (140) over a second wavelength range (120). An evaluation unit (60) compares the second wavelength dependency (140) with the reference wavelength dependency (100) for adjusting (160) the second wavelength dependency (140) in wavelength.
Claims14
A wavemeter comprising:
- a first wavelength determination unit having a substantially periodic wavelength dependency and being adapted for providing a reference wavelength dependency over a reference wavelength range,
- a second wavelength determination unit having a substantially periodic wavelength dependency and being adapted for providing a second wavelength dependency over a second wavelength range, and
- an evaluation unit adapted for comparing the second wavelength dependency with the reference wavelength dependency for adjusting the second wavelength dependency in wavelength.
A method comprising the steps of:
- (a) providing a reference wavelength dependency over a reference wavelength range making use of a first wavelength determination unit having a substantially periodic wavelength dependency,
- (b) providing a second wavelength dependency over a second wavelength range making use of a second wavelength determination unit having a substantially periodic wavelength dependency, and
- (c) comparing the second wavelength dependency with the reference wavelength dependency, and
- (d) adjusting the second wavelength dependency in wavelength based on the comparison in step.
Dependencies are inferred from the claim text.