Modular interface between test and application equipment
AssigneeAgilent Technologies, Inc.
InventorJochen Zaiser
Life of this patent
Estimating the term…
Abstract
Disclosed is an interface (300) for providing an electrical contact between a test equipment (25, 30) and an application equipment (10, 20). The interface (300) is adapted for receiving a plurality of individual segments (320i), whereby at least one of the segments (320i) comprises at least one electrical path (120, 130) for providing the electrical contact. At least one of the segments (320i) might be electrically isolated with respect to the interface (300) and/or other segments (320i), and can, have a ground condition substantially independent of the ground condition of the interface (300) and/or other segments (320i).
Claims10
An interface (300) for providing an electromagnetic link between a test equipment (25, 30) and an application equipment (10, 20), characterized in that the interface (300) is adapted for receiving a plurality of individual segments (320i), whereby at least one of the segments (320i) comprises at least one electromagnetic path (120, 130) for providing the electromagnetic link.
The interface (300) according to any one of the above claims, characterized in that at least one of the segments (320i) comprises a solid core (110), at least one signal path (120), and at least one ground contact (130), whereby the core (110) is electrically connected to the at least one ground contact (130), and the at least one signal path (120) is electrically isolated from the core (110).
The interface (300) according to any one of the above claims, characterized by further comprising a frame (305) with a plurality of recesses (310i), each for receiving one of the segments (320i).
The interface (300) according to any one of the above claims, characterized in that the electromagnetic link is an electrical and/or optical contact, and the electromagnetic path (120, 130) is an electrical and/or optical path (120, 130).
The interface (300) according to any one of the above claims, characterized in that the test equipment (25, 30) is an integrated circuit tester, and/or the application equipment (10, 20) is an integrated circuit handling equipment.
A test equipment (25, 30) for testing a device in an application equipment (10, 20), characterized by
- an interface (300) in accordance with any one of the above claims for providing an electrical contact between the test equipment (25, 30) and the application equipment (10, 20), and
- at least one segment (320i) having at least one electrical path (120, 130) for providing the electrical contact.
Dependencies are inferred from the claim text.