Method for calibrating scanning probe and computer-readable medium therefor
AssigneeMitutoyo Corporation
InventorsTakashi Noda, Hiromi Deguchi, Koji Takesako
Life of this patent
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AssigneeMitutoyo Corporation
InventorsTakashi Noda, Hiromi Deguchi, Koji Takesako
Estimating the term…
After preparatory measurement of a calibration reference with a scanning probe is performed, apart program for measuring the calibration reference is generated and executed so as to perform calibration measurement. After a calibration value of a coordinate transformation function and reference coordinates of the calibration reference are obtained, a new part program for measuring the calibration reference again is generated by use of the calibration value and the reference transformation coordinates and the part program is executed to perform calibration measurement. Accordingly, the calibration value of the coordinate transformation function and the reference coordinates of the calibration reference can be obtained with higher accuracy.
A method of calibrating a scanning probe, comprising:
A method of calibrating a scanning probe, comprising:
A method of calibrating a scanning probe, comprising:
Dependencies are inferred from the claim text.