US 2003/0067296 A1 · Method for evaluating contact pin integrity of electronic components having multiple contact pins

Abstract

An apparatus and method for evaluating the integrity of each contact pin of an electronic component having multiple contact pins. In one embodiment, the apparatus includes a test device and a measuring instrument. The test device comprises a component fixture configured to hold an electronic component under test and opposing contact plates for establishing electrical communication between the contact pins of the electronic component and the measuring instrument. The test device may include separate linear positioners associated with each opposing contact plate configured to move the contact plates relative to the component fixture and electronic component under test. The measuring instrument measures at least one electrical characteristic of a pin contact. In another embodiment, the apparatus further includes a system controller in communication with the measuring instrument and configured to control functioning of the measuring instrument.

Claims9

Dependent claims

A method of testing at least one contact pin of an electronic component configured for testing electrical characteristics of at least another electronic component connected thereto and having a plurality of laterally distinct contact pins through which said at least another electrical component is tested when connected thereto, said method comprising:

providing a measuring instrument;
providing said electrical component, without having any other electronic component connected thereto, having contact pins of said plurality of laterally distinct contact pins protruding from both a first surface of said electronic component and a second surface of said electronic component;
establishing electrical communication between at least said measuring instrument and at least one contact pin protruding from said first surface of said electronic component;
and
measuring at least one electrical characteristic of said at least one contact pin with said measuring instrument.

2 more elements

A method of testing at least one contact pin of an electronic component configured for testing electrical characteristics of at least another electronic component connected thereto and having a plurality of laterally distinct contact pins protruding from both a first surface of said electronic component and a second surface of said electronic component through which said at least another electrical component is tested when connected thereto, said method comprising:

electrically connecting said electronic component without any other electronic component connected thereto to a test device accepting said electronic component, making electrical contact with at least one first contact pin of said plurality of laterally distinct contact pins protruding from said first surface of said electronic component, and making electrical contact with at least one second contact pin of said plurality of laterally distinct contact pins protruding from said second surface of said electronic component;
providing a measuring instrument electrically communicating with said test device for measuring at least one electrical characteristic of each of said at least one first contact pin and said at least one second contact pin;
and
performing a test sequence measuring said at least one electrical characteristic of each of said at least one first contact pin and said at least one second contact pin of said electronic component without any other electronic component connected thereto.

1 more element

Dependencies are inferred from the claim text.

Method for evaluating contact pin integrity of electronic components having multiple contact pins

Life of this patent

Method for evaluating contact pin integrity of electronic components having multiple contact pins

Life of this patent

Abstract

Claims9