Interconnects with dielectric spacers and method for forming the same
OwnerYei-Hsiung Lin, Cheng-Hui Chung +1inventors
InventorsYei-Hsiung Lin, Cheng-Hui Chung, Chen-Chiu Hsue
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OwnerYei-Hsiung Lin, Cheng-Hui Chung +1inventors
InventorsYei-Hsiung Lin, Cheng-Hui Chung, Chen-Chiu Hsue
Estimating the term…
A method and a structure of interconnects with dielectric spacers is disclosed. A semiconductor substrate with a plurality of interconnects is provided. A conformal first dielectric layer is formed on the interconnects and the substrate. The first dielectric layer is partially etched back to expose a partial surface of the substrate and the top surface of the interconnects, leaving remaining first dielectric layers on the sides of the interconnects, wherein the remaining first dielectric layers are spacers. A second dielectric layer is formed on the substrate, the spacers and the interconnects, and planarization is performed on the second dielectric layer. Thus, the spacers serve as etching stop layers and/or supporting layers of the interconnects.
A method of manufacturing interconnects with dielectric spacers, comprising the steps of:
The method according to claim 1, wherein the interconnects are selected from the group consisting of Al interconnects, Cu interconnects and AlSiCu alloy interconnects formed by deposition.
A structure of interconnects with dielectric spacers, comprising:
The structure according to claim 8, wherein the material of the interconnects is selected from the group consisting of Al, Cu, and AlSiCu alloy.
The structure according to claim 8, wherein the material of the spacers is selected from the group consisting of silicon nitride and silicon oxynitride.
Dependencies are inferred from the claim text.