Semiconductor manufacturing method and semiconductor manufacturing apparatus
AssigneeSony Corporation
InventorToshiyuki Makita
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AssigneeSony Corporation
InventorToshiyuki Makita
Estimating the term…
Inspection of a semiconductor wafer is performed while a manufacturing process of another semiconductor wafer is executed. A plurality of semiconductor wafers are mounted on a semiconductor manufacturing apparatus and, while semiconductor the manufacturing process is executed, an arbitrary semiconductor wafer is removed from among the semiconductor wafers having finished the manufacturing process, to a position that is different from a position on the manufacturing apparatus defined for the plurality of semiconductor wafers. Inspection is then done for the removed wafer and, if it is evaluated as good, it is first returned to the position from which the wafer has been removed and then returned, along with the other semiconductor wafers to the original position on the manufacturing apparatus.
A semiconductor manufacturing method for forming a semiconductor circuit on a semiconductor wafer while performing semiconductor manufacturing process on said semiconductor wafer, said method comprising:
A semiconductor manufacturing apparatus for forming a semiconductor circuit on a semiconductor wafer while performing semiconductor manufacturing process on said semiconductor wafer, said apparatus comprising:
Dependencies are inferred from the claim text.