Sequential method for depositing a film by modulated ion-induced atomic layer deposition (MII-ALD)
AssigneeAngstron Systems, Inc.
InventorsTony P. Chiang, Karl F. Leeser
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AssigneeAngstron Systems, Inc.
InventorsTony P. Chiang, Karl F. Leeser
Estimating the term…
The present invention relates to an enhanced sequential atomic layer deposition (ALD) technique suitable for deposition of barrier layers, adhesion layers, seed layers, low dielectric constant (low-k) films, high dielectric constant (high-k) films, and other conductive, semi-conductive, and non-conductive films. This is accomplished by 1) providing a non-thermal or non-pyrolytic means of triggering the deposition reaction; 2) providing a means of depositing a purer film of higher density at lower temperatures; and, 3) providing a faster and more efficient means of modulating the deposition sequence and hence the overall process rate resulting in an improved deposition method.
A sequential method for depositing a thin film onto a substrate in a chamber comprising:
Dependencies are inferred from the claim text.