Semiconductor device with a self-testing function and a method for testing the semiconductor device

A semiconductor device with a self-testing function, comprising:

• first to n-th (n is an integer more than 1) macro blocks each of which receives input data, processes the input data, and outputs processed data;
• a data path which supplies data to-be-processed to said n macro blocks, and transmits processed data processed by and output from said n macro blocks respectively, in a normal operation mode;
• a test circuit which outputs test data for testing said n macro blocks and receives the test data processed by said n macro blocks, in a test mode;
• and
• a test path which supplies the test data output from said test circuit to said first macro block, supplies data output from said h-th (h is an integer from 1 to (n−1)) macro block to said (h+1)th macro block and supplies data output from said n-th macro block to said test circuit.