Measuring apparatus utilizing attenuated total reflection

A measuring apparatus utilizing attenuated total reflection, comprising:

• a dielectric block;
• a metal film, formed on one surface of said dielectric block, for placing a sample thereon;
• a light source for emitting a light beam;
• an optical system for making said light beam enter said dielectric block at various angles of incidence so that a condition for total internal reflection is satisfied at an interface between said dielectric block and said metal film;
• photodetection means, comprising a plurality of light-receiving elements juxtaposed in a predetermined direction and disposed to respectively receive components of said light beam totally reflected at said interface, for detecting attenuated total reflection due to surface plasmon resonance from a dark line occurring in the totally reflected light beam;
• movement means for moving said photodetection means in the direction where said plurality of light-receiving elements are juxtaposed;
• position detection means for detecting position of said photodetection means moved by said movement means;
• storage means for storing the position of said photodetection means detected by said position detection means;
• and
• control means for controlling said movement means when said attenuated total reflection is detected a plurality of times for a single sample, by disposing said photodetection means at a predetermined position relative to said dark line when a first measurement is made and also disposing said photodetection means at the same position as said predetermined position stored in said storage means when a second measurement and measurements thereafter are made.

A measuring apparatus utilizing attenuated total reflection, comprising:

• a dielectric block;
• a cladding layer formed on one surface of said dielectric block;
• an optical waveguide layer, formed on said cladding layer, for placing a sample thereon;
• a light source for emitting a light beam;
• an optical system for making said light beam enter said dielectric block at various angles of incidence so that a condition for total internal reflection is satisfied at an interface between said dielectric block and said cladding layer;
• photodetection means, comprising a plurality of light-receiving elements juxtaposed in a predetermined direction and disposed to respectively receive components of said light beam totally reflected at said interface, for detecting attenuated total reflection due to a waveguide mode excited in said optical waveguide layer, from a dark line occurring in the totally reflected light beam;
• movement means for moving said photodetection means in the direction where said plurality of light-receiving elements are juxtaposed;
• position detection means for detecting position of said photodetection means moved by said movement means;
• storage means for storing the position of said photodetection means detected by said position detection means;
• and
• control means for controlling said movement means when said attenuated total reflection is detected a plurality of times for a single sample, by disposing said photodetection means at a predetermined position relative to said dark line when a first measurement is made and also disposing said photodetection means at the same position as said predetermined position stored in said storage means when a second measurement and measurements thereafter are made.