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US 2002/0153552 A1Published application
Semiconductor device and method for manufacturing the smae
AssigneeKabushiki Kaisha Toshiba
InventorsKATSUHIKO HIEDA, KAZUHIRO EGUCHI
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Abstract
A semiconductor device comprises a lower electrode shaped as a convex formed on a semiconductor substrate having crystals, a grain boundary between adjacent crystals being perpendicular to a side of the lower electrode, a capacitor insulating film covering the lower electrode, and an upper electrode formed on the capacitor insulating film.
Claims23
A semiconductor device comprising:
- a lower electrode shaped as a convex formed on a semiconductor substrate, said lower electrode having crystals, a grain boundary between adjacent crystals being perpendicular to a side of the lower electrode;
- a capacitor insulating film covering the lower electrode;
- and
- an upper electrode formed on the capacitor insulating film.
1 more element
A semiconductor device comprising:
- a semiconductor substrate;
- a conductive plug formed on the semiconductor substrate;
- a lower electrode formed in contact with the conductive plug and constituted by a plurality of crystal grains;
- a capacitor insulating film formed on a side of the capacitor lower electrode;
- and
- a upper electrode formed above the lower electrode via the capacitor dielectric film,
- a grain boundary between adjacent two of said plurality of crystal grains constituting the lower electrode being substantially perpendicular to an interface between the lower electrode and the capacitor insulating film.
4 more elements
A semiconductor device comprising:
- a semiconductor substrate;
- a conductive plug formed on the semiconductor substrate;
- a lower electrode formed in contact with the conductive plug;
- a capacitor insulating film formed on a side of the lower electrode;
- and
- a upper electrode formed above the lower electrode via the capacitor insulating film,
- the capacitor insulating film being formed above a top surface of the lower electrode via a second insulating film different from the capacitor insulating film.
4 more elements
A method for manufacturing a semiconductor device comprising the steps of:
- forming on a semiconductor substrate a mask layer having a hole through which a plug electrode is exposed;
- burying a lower electrode in the hole of the mask layer;
- forming a capacitor insulating film covering the lower electrode;
- and
- forming an upper electrode on the capacitor insulating film.
2 more elements
Dependencies are inferred from the claim text.