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AssigneeRenesas Technology Corp.
InventorsMari Shibayama, Yoshinori Fujiwara, Yoshihiro Nagura
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The invention provides a semiconductor device capable of appropriately debugging any fluctuation in element characteristic even when the element characteristic fluctuates exceeding a value estimated at the designing stage. This semiconductor device includes a process monitor circuit that monitors any fluctuation in process and outputs a monitor signal M representing a result of monitoring, in addition to circuit blocks that perform respectively required functions. And a timing control circuit that controls timing of an input signal inputted to a predetermined circuit element forming the circuit blocks based on the monitor signal M from the process monitor circuit is provided in the circuit blocks.
A semiconductor device with a process monitor circuit comprising:
A semiconductor device defined comprising a process monitor circuit that monitors fluctuation in process and outputs a result of monitoring to outside, said process monitor circuit being comprised of:
A test method for the semiconductor device provided with a process monitor circuit that monitors fluctuation in process and outputs a result of monitoring to outside;
Dependencies are inferred from the claim text.