Semiconductor memory device and storage method thereof
AssigneeKabushiki Kaisha Toshiba
InventorsNoboru Shibata, Tomoharu Tanaka
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AssigneeKabushiki Kaisha Toshiba
InventorsNoboru Shibata, Tomoharu Tanaka
Estimating the term…
For a verify operation using potential Vbi′, the data of a memory cell is preliminarily read by using potential Vai+1 and the state of the memory cell is stored in a latch circuit. Then, a verify/read operation is conducted by using potential Vbi′. If the state of the cell is higher than Ai+1, the outcome of the verify/read operation is forcibly brought down to a low level. Thus, only two latch circuits are required for storing an n-bit data, including one for storing the data to be written and one for preliminarily reading if the state of the cell is higher than Ai+1 or not and storing the outcome of the preliminary reading.
A storage method of a memory device comprising memory cells (M1 through M16) adapted to have 21 states for the first write operation, 22 states for the second write operation and 2k=n states (k, n representing respective natural numbers) for the n-th write operation, said method comprising:
A semiconductor memory device comprising:
A semiconductor memory device comprising:
A storage method of a memory device comprising memory cells adapted to have n-valued states, said method comprising:
A storage method of a memory device comprising memory cells adapted to have k-bit n-valued states (=2k), said method comprising:
Dependencies are inferred from the claim text.