Pattern detection, processing and testing apparatus
OwnerMasataka Shiratsuchi, Yoshinori Honguh +2inventors
InventorsMasataka Shiratsuchi, Yoshinori Honguh, Tsutomu Saito, Seiji Ikari
Life of this patent
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OwnerMasataka Shiratsuchi, Yoshinori Honguh +2inventors
InventorsMasataka Shiratsuchi, Yoshinori Honguh, Tsutomu Saito, Seiji Ikari
Estimating the term…
A pattern detecting apparatus is provided with an illuminating device which separates a detected surface into a plurality of irradiation areas and irradiates an irradiation light to adjacent irradiation areas from different directions, an imaging device which overlaps and images the irradiation areas with a mask generating a moire, and an image processing device which detects a phase difference of a concentration change of the moire image in the irradiation areas when the moire image is obtained by the imaging device, thereby judging whether or not a pattern exists.
A pattern detecting apparatus detecting whether or not a pattern exists on a detected surface, comprising:
A pattern detecting apparatus detecting whether or not a pattern exists on a detected surface, comprising:
A pattern detecting apparatus detecting whether or not a pattern provided on a detected surface of a tested body exists, comprising:
A pattern detecting apparatus detecting a pattern on a detected surface of a subject, comprising:
A pattern detecting apparatus detecting a pattern on a detected surface of a subject, comprising:
Dependencies are inferred from the claim text.