Tester and related method for testing electrical parameters of circuit paths

A tester for a circuit path comprising at least one electronic circuit device, the tester comprising:

• a voltage controlled oscillator (VCO) for generating a controllable frequency oscillating test signal and having a controllable amplitude defined between first and second voltages, at least one of the first and second voltages being controllable so that said VCO generates the oscillating test signal to selectively have one of an amplitude greater than, less than, and equal to an amplitude of an output of the circuit path;
• a multiplexer for selectively connecting one of the oscillating test signal, the first voltage, and the second voltage to the circuit path;
• and
• a selector for selectively connecting said multiplexer to the circuit path.

An integrated circuit comprising:

• a circuit path comprising at least one electronic circuit device;
• and
• a tester comprising
• a voltage controlled oscillator (VCO) for generating a controllable frequency oscillating test signal and having a controllable amplitude defined between first and second voltages, at least one of the first and second voltages being controllable so that said VCO generates the oscillating test signal to selectively have one of an amplitude greater than, less than, and equal to an amplitude of an output of the circuit path,
• a multiplexer for selectively connecting one of the oscillating test signal, the first voltage, and the second voltage to the circuit path, and
• a selector for selectively connecting said multiplexer to said circuit path.

A method for testing a circuit path comprising a plurality of electronic circuit devices connected together, the method comprising:

• generating first and second voltages;
• generating a controllable frequency oscillating test signal having a controllable amplitude defined between the first and second voltages using a voltage controlled oscillator (VCO);
• controlling at least one of the first and second voltages so that the VCO generates the oscillating test signal to selectively have one of an amplitude greater than, less than, and equal to an amplitude of an output of the circuit path;
• controlling the frequency of the oscillating test signal based upon one of the first and second voltages;
• and
• selectively connecting one of the oscillating test signal, the first voltage, and the second voltage to the circuit path.

A method for testing a circuit path comprising at least one electronic circuit device, the method comprising:

• generating first and second voltages;
• generating a controllable frequency oscillating test signal having a controllable amplitude defined between the first and second voltages using a voltage controlled oscillator (VCO);
• controlling at least one of the first and second voltages so that the VCO generates the oscillating test signal to selectively have one of an amplitude greater than, less than, and equal to an amplitude of an output of the circuit path;
• and
• selectively connecting one of the oscillating test signal, the first voltage, and the second voltage to the circuit path.