US 2002/0000820 A1 · Test probe and connector

Abstract

An improved probe includes a conductive tubular housing or body containing a coil spring and a conductive plunger movable in the housing and having a contact tip outwardly extending from one end of the housing. The plunger and tip are urged to a normally outward position by the bias force of the spring. The opposite end of the housing has an opening for mating with a conductive pin of a connector. The connector is retained in a mounting plate of an associated fixture and has terminal ends of desired configuration. The terminal end may include a wire-wrap pin, a crimp type terminal for attachment to a wire, or the terminal may include a spring loaded pin for engagement with an associated electrical contact. An air tight seal may be provided between the probe and the connector and the connector may be mounted in a mounting such that when vacuum is applied to an associated test fixture, air cannot be drawn through the fixture or through the body of the probe.

Claims11

Dependent claims

A probe, suitable for use in a socketless fixture and for providing electrical contact with electrical circuits during testing thereof, said probe comprising:

an electrically conductive tubular housing;
a circuit contacting electrically conductive plunger captively disposed in said electrically conductive tubular housing in electrically conductive contact therewith, said plunger having a circuit contacting tip urged outward from the housing under the force of a longitudinally compressed coil spring;
said tubular housing having a first end portion through which the plunger extends to the tip and by which the plunger is retained in the housing and a second end defining an opening sized to receive and retain an electrically conductive connector pin forming part of a connector to provide electrically conductive connection to the probe.

A probe and connector assembly for use in a socketless fixture and for providing electrical contact with electrical circuits during testing thereof, said assembly comprising:

a probe comprising:
an electrically conductive tubular housing;
an electrically conductive plunger captively disposed in the electrically conductive tubular housing in electrically conductive contact therewith and having a circuit contacting tip urged outward from the housing under the force of a longitudinally compressed coil spring;
said tubular housing having a first end portion through which the plunger extends to the tip and by which the plunger is retained in the housing and a second end defining an opening;
an electrically conductive connector comprising:
a pin forming part of the connector and sized to achieve an interference fit with said housing second end when disposed within said opening, said pin providing electrically conductive connection between the connector and the probe when disposed within said opening.

3 more elements

Dependencies are inferred from the claim text.

Test probe and connector

Life of this patent

Test probe and connector

Life of this patent

Abstract

Claims11