CPU adapter for a motherboard test machine
AssigneeASUSTeK COMPUTER INC.
InventorsGen-Ki Lin, Chao-Ching Chang
Life of this patent
Estimating the term…
Abstract
A CPU adapter of a motherboard test machine installed in a test machine of a motherboard to be tested. The CPU adapter is capable of combined with the CPU and coupled to the motherboard to be tested while testing. The circuit design of the CPU adapter can enhance the signals of the CPU and widen the clock thereof. The signals of the CPU can be transmitted to the motherboard to be tested correctly. Instead of insertion and removal of the CPU by manpower, it can thus accelerate the testing speed, lower the hazard of damaging the computer component, and decrease the demand for test tools.
Claims15
An adapter for a high-frequency component of a test machine installed in a test machine of a Printed Circuit Board (PCB) to be tested, the adapter for the high-frequency component comprising:
- a revolving board for combining with the high-frequency component, capable of widening the clock of the high-frequency component by an widening clock circuit;
- and
- a plurality of probes disposed on and coupled to the revolving board, capable of being coupled to the pins of the PCB to be tested.
A test machine of a Printed Circuit Board (PCB) with an exterior high-frequency component, capable of testing a PCB to be tested, the test machine comprising:
- a carrier for carrying the PCB to be tested, having a plurality of guide holes located opposite to the pins on the bottom surface of the PCB to be tested;
- a function test box under the carrier, wherein a probe load board is upon the function test box, and the probe load board comprises:
- a plurality of probes on the top surface, located opposite to the guide holes, capable of inserting into the guide holes and coupled to the pins of the PCB to be tested;
- and
- a revolving board on the bottom surface of the probe load board, combined with the high-frequency component and coupled to the probes, capable of widening the clock of the high-frequency component by a widening clock circuit;
- and
- a shingle above the carrier, capable of coupling the PCB to be tested to the probes.
Dependencies are inferred from the claim text.