Cleaning method and polishing apparatus employing such cleaning method
AssigneeEbara Corporation
InventorsYutaka Wada, Hirokuni Hiyama, Norio Kimura
Life of this patent
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AssigneeEbara Corporation
InventorsYutaka Wada, Hirokuni Hiyama, Norio Kimura
Estimating the term…
A method is suitable for cleaning substrates, after polishing, that require a high degree of cleanliness, such as semiconductor wafers, glass substrates, or liquid crystal displays. The method comprises polishing a substrate using an abrasive liquid containing abrasive particles, and cleaning a polished surface of the substrate by supplying a cleaning liquid having substantially the same pH as the abrasive liquid or similar pH to the abrasive liquid so that a pH of the abrasive liquid attached to the polished surface of the substrate is not rapidly changed.
An apparatus for polishing and then cleaning a substrate, said apparatus comprising:
An apparatus for polishing and then cleaning a substrate, said apparatus comprising:
An apparatus for polishing and then cleaning a substrate, said apparatus comprising:
An method for polishing and then cleaning a substrate, said method comprising:
An method for polishing and then cleaning a substrate, said method comprising:
Dependencies are inferred from the claim text.