Pattern-based defect description method
AssigneeSeagate Technology LLC
InventorsYing Ee Yip, Aik Chuan lim, Yong Peng Chng, Steven TianChye Cheok, Wei Loon Ng
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AssigneeSeagate Technology LLC
InventorsYing Ee Yip, Aik Chuan lim, Yong Peng Chng, Steven TianChye Cheok, Wei Loon Ng
Estimating the term…
The present invention provides a method of describing defects that requires less memory space than conventional methods. Entries of a first defect table are sorted according to the type of track layout, or zones. They are then grouped into clusters. Each cluster is characterized by a set of new parameters, including a starting sector, a scratch parameter, a span parameter, and an angle parameter. The new parameters are stored in a second table, replacing the corresponding entries in the first table. In this manner, a single entry in the second table replaces one or more entries in the first table with one entry in the first table.
In a disc drive comprising at least one disc having a plurality of addressable sectors arranged in a plurality of tracks on a surface of the disc, the sectors being categorised into zones such that data is capable of being written to and read from different zones at different rates, a method of storing information on defective sectors comprising steps of:
Dependencies are inferred from the claim text.