ESD protection apparatus and method for fabricating the same
AssigneeNEC Corporation
InventorMototsugu Okushima
Life of this patent
Estimating the term…
Abstract
To make electric current concentration and electric field concentration hardly take place in junction parts even in case of performing miniaturization and to achieve triggering at low voltage. An ESD protection apparatus is installed between an input terminal 6 of a semiconductor integrated circuit chip and a CMOS transistor 100 and includes a trigger element 310 comprising diodes 311, 312 which are broken down by overvoltage applied to the input terminal 6 and an ESD protection element 210 including longitudinal bipolar transistors 211, 212 for discharging the accumulated electric charge of the input terminal 6 by being electrically communicated owing to the breakdown of the diodes 311, 312.
Claims36
An ESD protection apparatus installed between a pad of a semiconductor integrated circuit chip and an inner circuit of said semiconductor integrated circuit chip, comprising:
- a trigger element having a diode to be broken down by overvoltage applied to said pad;
- and
- an ESD protection element having a longitudinal bipolar transistor for discharging the accumulated electric charge of said pad by being electrically communicated attributed to the breakdown of said diode.
An ESD protection apparatus installed between a pad of a semiconductor integrated circuit chip and an inner circuit of said semiconductor integrated circuit chip, comprising:
- a trigger element having a first longitudinal bipolar transistor whose collector and base act as a diode to be broken down by overvoltage applied to said pad and which discharges the accumulated electric charge of said pad by being electrically communicated due to the breakdown of the diode;
- and
- an ESD protection element having a second longitudinal bipolar transistor for discharging the accumulated electric charge of said pad by being electrically communicated attributed to the breakdown of the diode.
Dependencies are inferred from the claim text.