Semiconductor device tester and method of testing semiconductor device

A method of testing a semiconductor device, comprising the steps of:

• (a) positioning an electrically conductive sheet above a first area in which a semiconductor device to be tested is to be mounted on a tester substrate having the same structure as a structure of a substrate as a product except that a semiconductor device is not mounted on said tester substrate, said electrically conductive sheet being electrically insulating in a certain direction;
• (b) compressing said semiconductor device onto said electrically conductive sheet to thereby electrically connect an externally projecting terminal of said semiconductor device to a connection terminal mounted on said tester substrate in said first area;
• (c) inputting a test signal into said semiconductor device through said tester substrate and receiving said test signal from said semiconductor device through said tester substrate;
• and
• (d) judging whether said semiconductor device is non-defective or defective in accordance with results of said step (c).