Particle signal processing apparatus and particle measurement apparatus using same
AssigneeSysmex Corporation
InventorsKunio Ueno, Seiya Shinabe, Yoichi Nakamura
Life of this patent
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AssigneeSysmex Corporation
InventorsKunio Ueno, Seiya Shinabe, Yoichi Nakamura
Estimating the term…
A particle signal processing apparatus which processes a particle signal representative of characteristics of particles includes an amplifier having input and output terminals for amplifying a particle signal including serial pulses to output an output signal including the amplified serial pulses, a filter section for extracting a low frequency component from the output signal of the amplifier so that the extracted component is fed back into the input terminal as a negative feedback signal, and a feedback signal control section for allowing the filter section to fix the negative feedback signal when each of the amplified pulses rises and to hold the fixed negative feedback signal while the amplified pulse is larger than a threshold value.
A particle signal processing apparatus which processes a particle signal representative of characteristics of particles, comprising:
Dependencies are inferred from the claim text.