Method and apparatus for measuring geometry elements
AssigneeMitutoyo Corporation
InventorsNaoya Kikuchi, Hirokazu Michiwaki
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitutoyo Corporation
InventorsNaoya Kikuchi, Hirokazu Michiwaki
Estimating the term…
The invention provides a method and apparatus for measuring geometry elements, which can achieve a high-speed processing with improved operability. A distribution of sample points, which are obtained by a three-dimensional coordinate measuring machine, is examined to classify into zero through third degrees. A geometry element, or an object to be measured, is discriminated on the basis of the distribution of the sample points (zero through third degrees) and the number of the sample points. When the number of the sample points is equal to 2 or more and the distribution of the sample points is of the second degree, the geometry element can be discriminated as a plane or a circle in consideration of the probe moving direction. When the number of the sample points is equal to 6 or more, the geometry element can be discriminated as a cylinder or a circular cone on the basis of calculation of a half vertical angle of a circular cone that is specified from the sample points.
An apparatus for measuring geometry elements, comprising:
An apparatus for measuring geometry elements, comprising:
A method of measuring geometry elements, comprising the steps of:
A method of measuring geometry elements, comprising the steps of:
Dependencies are inferred from the claim text.