Method and apparatus for repairing defective columns of memory cells
AssigneeMicron Technology, Inc.
InventorBrian M. Shirley
Life of this patent
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AssigneeMicron Technology, Inc.
InventorBrian M. Shirley
Estimating the term…
A pair of coupling transistors are connected in series with isolation transistors in each of a plurality of column node circuits coupled to first and second arrays of memory cells arranged in rows and columns. The coupling transistors for the complimentary digit lines in each column node circuit are rendered non-conductive in the event memory cells connected to the coupling transistors through digit lines of the first and second array are defective. As a result, defective memory cells in the first and second arrays are isolated from sense amplifiers in the column node circuits so that the sense amplifiers cannot affect non-defective memory cells.
A memory device, comprising
A column circuit adapted for coupling to a first array of memory cells arranged in rows and columns, the column circuit comprising:
A computer system, comprising:
A method of coupling data signals between of a plurality of pairs of complimentary digit lines in a first array of memory cells and a plurality of column circuits, the method comprising:
Dependencies are inferred from the claim text.