Electrostatic chuck, and method of and apparatus for processing sample using the chuck
AssigneeHitachi, Ltd.
InventorsSeiichiro Kanno, Tatehito Usui, Ken Yoshioka, Saburo Kanai, Youichi Itou
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AssigneeHitachi, Ltd.
InventorsSeiichiro Kanno, Tatehito Usui, Ken Yoshioka, Saburo Kanai, Youichi Itou
Estimating the term…
A sample processing method includes electrostatically attracting and holding a sample on an electrostatic chuck which includes a pair of electrodes having different polarities and being concentrically disposed, and a dielectric film formed on top surfaces of the pair of electrodes, by applying a DC voltage between the pair of electrodes. The sample which is attracted and held on the chuck through the dielectric film is subjected to plasma processing while applying a bias voltage. The application of the bias voltage applied during plasma processing is stopped after termination of processing the sample, and an unbalance between electric charges stored on attracting portions of the dielectric film formed on the electrodes is eliminated by continuing generation of the plasma for a specific time after stopping the application of the bias voltage. The plasma is extinguished after an elapse of the specific time.
A sample processing method, comprising the steps of:
A sample processing method, comprising the steps of:
Dependencies are inferred from the claim text.