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US 2001/0011904 A1Published application
Integrated circuit having a self-test device for carrying out a self-test of the integrated circuit
AssigneeInfineon Technologies AG
InventorsRobert Kaiser, Florian Schamberger
Life of this patent
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Abstract
An integrated circuit includes a self-test device which is provided for executing a self-test of the integrated circuit and which has a control output. A program memory is connected to the self-test device for storing at least one test program supplied from outside the integrated circuit. The test program is run by the self-test device during execution of a self-test. The self-test device controls loading of a respective test program to be run into the program memory from outside the integrated circuit through the control output thereof.
Claims3
In an integrated circuit, the improvement comprising:
- a self-test device for carrying out a self-test of the integrated circuit, said self-test device having a control output;
- and
- a program memory connected to said self-test device for storing at least one test program supplied from outside the integrated circuit and executed while said self-test device carries out a self-test;
- said self-test device using said control output to control loading of a respective test program to be executed, from outside the integrated circuit into said program memory.
1 more element
Dependencies are inferred from the claim text.