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US 12,770,941 B2Granted
Test mechanism, battery test system, and battery production system
AssigneeContemporary Amperex Technology Co., Limited
InventorsLixin Guo, Bo Liu, Yankun Li, Keyu Ruan, Shaoteng Ren
Life of this patent
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Abstract
A test mechanism includes a base, a limiting member disposed on the base, and a conductive member disposed on the base and spaced apart from the limiting member. A space between the conductive member and the limiting member is used for placing a unit under test, the limiting member is configured to abut against the unit under test, and the conductive member is configured to elastically abut against a test terminal of the unit under test.
Claims19
A test mechanism, comprising:
- a base;
- a limiting member disposed on the base;
- and
- a conductive member disposed on the base and spaced apart from the limiting member, wherein a space between the conductive member and the limiting member is used for placing a unit under test, the unit under test is placed above the base along a first direction, the limiting member is configured to abut against the unit under test along a second direction, and the conductive member is configured to elastically abut against a test terminal of the unit under test along the second direction, the first direction being perpendicular to the second direction;
- wherein the conductive member comprises a first component disposed on the base and a second component configured to abut against the test terminal of the unit under test, the second component being connected to an end of the first component, and a gap that allows relative elastic deformation of the second component and the first component being formed therebetween.
2 more elements
A test mechanism, comprising:
- a base;
- a limiting member disposed on the base;
- and
- a conductive member disposed on the base and spaced apart from the limiting member, wherein a space between the conductive member and the limiting member is used for placing a unit under test, the limiting member is configured to abut against the unit under test, and the conductive member is configured to elastically abut against a test terminal of the unit under test;
- wherein the conductive member comprises a first component disposed on the base and a second component configured to abut against the test terminal of the unit under test, the second component being connected to an end of the first component, and a gap that allows relative elastic deformation of the second component and the first component being formed therebetween.
2 more elements
Dependencies are inferred from the claim text.