Module and system for, and method of detecting defects in ultra-thin glass
AssigneeSamsung Display Co., Ltd.
InventorsYunku Kang, Sungmin Park, Janghoon Lee, Leegu Han
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AssigneeSamsung Display Co., Ltd.
InventorsYunku Kang, Sungmin Park, Janghoon Lee, Leegu Han
Estimating the term…
An automatic inspection system for detecting defects in ultra-thin glass is disclosed that includes an edge inspection module for inspecting for chipping and wedge defects caused during laser cutting of the ultra-thin glass into cell units, a surface inspection module for inspecting scratches, cracks, and foreign substances on a surface of the ultra-thin glass, a phase measurement beam deflection (PMD) module for inspecting the surface of the ultra-thin glass for smudges and depressions through phase change measurement, and a Pt-derived ultra-fine defect inspection module for inspecting the ultra-thin glass for Pt-derived ultra-fine defects.
An automatic inspection system for detecting defects in ultra-thin glass, comprising:
An automatic detecting module for detecting ultra-fine defects in ultra-thin glass, comprising:
A method of automatically inspecting ultra-fine glass for Pt-derived ultra-fine defects, comprising:
A method of inspecting ultra-thin glass for Pt-derived ultra-fine defects, comprising:
A method of inspecting ultra-thin glass for Pt-derived ultra-fine defects comprising:
Dependencies are inferred from the claim text.